TY  - JOUR
AU  - Miranda Pantoja, José Miguel
AU  - Muñoz San Martín, Sagrario
AU  - Sebastián Franco, José Luis
PY  - 2002
DO  - 10.1109/TIM.2002.803077
SN  - 0018-9456
UR  - https://hdl.handle.net/20.500.14352/58936
T2  - IEEE Transaction on instrumentation and measurement
AB  - In this paper, we investigate how critical the calibration kit is on an accurate estimation of microwave device parasitic elements. The semiempirical cold FET method has been applied to the extraction of the small signal equivalent circuit of several...
LA  - eng
M2  - 650
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Noise.
TI  - Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies
TY  - journal article
VL  - 51
ER  -