RT Journal Article
T1 Dual self-image technique for beam collimation
A1 Herrera Fernández, José María
A1 Sánchez Brea, Luis Miguel
A1 Torcal Milla, Francisco José
A1 Morlanes Calvo, Tomás
A1 Bernabeu Martínez, Eusebio
AB We propose an accurate technique for obtaining highly collimated beams, which also allows testing the collimation degree of a beam. It is based on comparing the period of two different self-images produced by a single diffraction grating. In this way, variations in the period of the diffraction grating do not affect to the measuring procedure. Self-images are acquired by two CMOS cameras and their periods are determined by fitting the variogram function of the self-images to a cosine function with polynomial envelopes. This way, loss of accuracy caused by imperfections of the measured self-images is avoided. As usual, collimation is obtained by displacing the collimation element with respect to the source along the optical axis. When the period of both self-images coincides, collimation is achieved. With this method neither a strict control of the period of the diffraction grating nor a transverse displacement, required in other techniques, are necessary. As an example, a LED considering paraxial approximation and point source illumination is collimated resulting a resolution in the divergence of the beam of σ φ = ± μrad.
PB IOP Publishing
SN 2040-8978
YR 2016
FD 2016-06-14
LK https://hdl.handle.net/20.500.14352/24622
UL https://hdl.handle.net/20.500.14352/24622
LA eng
NO © 2016 IOP Publishing Ltd.The authors thank to O J Casas for his valuable comments. This work has been supported by project DPI2011-27851 of the Ministerio de Economía y Competitividad of Spain and the SEGVAUTO-TRIES Tecnologías 2013 CM S2013/MIT-2713 program of the Comunidad de Madrid.
NO Ministerio de Economía y Competitividad (MINECO)
NO Comunidad de Madrid
DS Docta Complutense
RD 20 abr 2025