TY  - JOUR
AU  - Clemente Barreira, Juan Antonio
AU  - Franco Peláez, Francisco Javier
AU  - Fabero Jiménez, Juan Carlos
AU  - Mecha López, Hortensia
AU  - Rezaei, Mohammadreza
AU  - Hubert, Guillaume
AU  - Martín Holgado, Pedro
PY  - 2022
DO  - 10.1109/TNS.2022.3140473
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/71329
T2  - IEEE Transactions on Nuclear Science
AB  - In aerospace industry, Commercial-Off-The-Shelf (COTS) Static Random Access Memories (SRAMs) are a cost-effective solution for obtaining high performance at the system level, which is difficult to obtain using space qualified components. Additionally,...
LA  - eng
M2  - 126
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - COTS
KW  - SRAM
KW  - Proton tests
KW  - Radiation hardness
KW  - Reliability
KW  - Soft error
KW  - MUSCA-SEP3
TI  - Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
TY  - journal article
VL  - 69
ER  -