%0 Journal Article
%A Lucía Mulas, María Luisa
%A Sánchez Quesada, Francisco
%T Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates
%D 2006
%@ 1098-0121
%U https://hdl.handle.net/20.500.14352/51240
%X We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.
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