RT Journal Article
T1 Method of error analysis for phase-measuring algorithms applied to photoelasticity
A1 Quiroga Mellado, Juan Antonio
A1 González Cano, Agustín
AB We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jones matrix of the real polariscope can then be calculated as a sum of the nominal matrix and a series of contributions that depend on the errors associated with each element separately. We apply this method to the analysis of phase-measuring algorithms for the determination of isoclinics and isochromatics, including comparisons with real measurements.
PB The Optical Society of America
SN 0003-6935
YR 1998
FD 1998-07-10
LK https://hdl.handle.net/20.500.14352/58798
UL https://hdl.handle.net/20.500.14352/58798
LA eng
NO 1.	C. Buckberry and D. Towers, “Automatic analysis of isochromatic and isoclinic fringes in photoelasticity using phase-measuring techniques”, Meas. Sci. Technol. 6, 1227–1235 (1995). 2.	T. Franz, A. Maidhof, and J. Sun, “Verfahren und Vorrichtung zur Bestimmung der Isochromatenwerte in der Spannungsoptik”, German patent DE-195 03 851 A1 (10 August 1995). 3.	A. D. Nurse, “Full-field automated photoelasticity by use of a three-wavelength approach to phase stepping”, Appl. Opt. 36, 5781–5786 (1997). 4.	J. A. Quiroga and A. González-Cano, “Phase-measuring algorithm for the extraction of isochromatics of photoelastic fringe patterns”, Appl. Opt. 36, 8397–8402 (1997). 5.	K. Freischlad and C. L. Kouliopoulos, “Fourier description of digital phase-measuring interferometry”, J. Opt. Soc. Am A 7, 542–551 (1990). 6.	J. van Wingerden, H. J. Frankena, and C. Smorenburg, “Linear approximation for measurement errors in phase-shifting interferometry”, Appl. Opt. 30, 2718–2729 (1991). 7.	P. S. Theocaris and E. E. Gdoutos, Matrix Methods in Photoelasticity (Springer-Verlag, Berlin, 1979).
NO © 1998 Optical Society of America.We thank Eusebio Bernabeu, Director of the Optics Department of the Universidad Complutense, for his help and continual support. Also, we wish to thank Hans Steinbichler, Steinbichler Optotechnik, GmbH, for helping us with the acquisition of experimental images. This work was partially supported by project MAT 95-0767-C02-02 of the Comisión Interministerial de Ciencia y Tecnología of Spain.
NO Comisión Interministerial de Ciencia y Tecnología of Spain
DS Docta Complutense
RD 22 ago 2024