RT Book, Section
T1 Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches
A1 Franco Peláez, Francisco Javier
A1 Zong, Yi
A1 Agapito Serrano, Juan Andrés
A1 Casas-Cubillos, Juan
A1 Rodríguez-Ruiz, Miguel Ángel
AB Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related to the power supplies: an increase in the lowest supply voltage capable of biasing correctly the devices; some devices cannot work with TTL logic levels. In addition, hysteresis phenomena appear.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 0-7803-8697-3
YR 2004
FD 2004-07-22
LK https://hdl.handle.net/20.500.14352/53407
UL https://hdl.handle.net/20.500.14352/53407
LA eng
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NO © IEEEIEEE Radiation Effects Data Workshop (2004, Atlanta).This work was supported by the cooperation agreement K476/LHC between CERN and UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by ITN.
NO Ministerio de Educación y Ciencia
NO CERN
NO ITN (Portugal)
NO Universidad Complutense de Madrid
NO CICYT
DS Docta Complutense
RD 6 may 2024