TY  - CHAP
AU  - Franco Peláez, Francisco Javier
AU  - Zong, Yi
AU  - Agapito Serrano, Juan Andrés
AU  - Casas-Cubillos, Juan
AU  - Rodríguez-Ruiz, Miguel Ángel
PY  - 2004
DO  - 10.1109/REDW.2004.1352912
SN  - 0-7803-8697-3
UR  - https://hdl.handle.net/20.500.14352/53407
AB  - Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related to...
LA  - eng
M2  - 91
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - CMOS analogue integrated circuits
KW  - Field effect transistor switches
KW  - Gamma-ray effects
KW  - Hysteresis
KW  - Neutron effects
KW  - LHC
KW  - TID tests
KW  - TTL logic levels
KW  - Device biasing voltage
KW  - Hysteresis phenomena
KW  - Irradiated analog CMOS switches
KW  - Large hadron collider
KW  - Lowest supply voltage phenomena
KW  - Neutron fluence
KW  - Radiation tests
KW  - Switching threshold voltage shift
KW  - Total gamma dose
KW  - Total ionizing dose
KW  - CMOS logic circuits
KW  - Cryogenics
KW  - Large Hadron Collider
KW  - Logic devices
KW  - Neutrons
KW  - Pulse inverters
KW  - Switches
KW  - System testing
KW  - Voltage
TI  - Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches
TY  - book part
ER  -