TY  - CHAP
AU  - Quiroga Mellado, Juan Antonio
AU  - Vargas Balbuena, Javier
PY  - 2008
DO  - 10.1117/12.814516
SN  - 978-0-8194-7398-1
UR  - https://hdl.handle.net/20.500.14352/53281
AB  - Reliable inspection of large surfaces with low depth recovery error is needed in a wide variety of industrial applications, for example in external defect inspection in aeronautical surfaces. Active triangulation measurement systems with a rigid...
PB  - SPIE--The International Society for Optical Engineering
KW  - Topometry
KW  - Surfaces
TI  - Defect inspection by an active 3D multiresolution technique
TY  - book part
VL  - Part 1-2
ER  -