RT Journal Article
T1 Cathodoluminescence from nanocrystalline silicon films and porous silicon
A1 Piqueras de Noriega, Javier
A1 Méndez Martín, Bianchi
A1 Plugaru, R.
A1 Craciun, G.
A1 García, J. A.
A1 Remon, A.
AB Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show a dominant band at 400 nm as well as a band centered at about 650 nm. CL spectra of porous silicon samples also show emission at 400 nm. Spectral changes induced by annealing and implantation treatments of the films suggest that the presence of nanocrystals is the origin of the observed CL.
PB Springer
SN 0947-8396
YR 1999
FD 1999-03
LK https://hdl.handle.net/20.500.14352/58945
UL https://hdl.handle.net/20.500.14352/58945
LA eng
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NO © Springer.This work was supported by NATO (Grant HTECH. CRG 961392) and DGES (Project PB96-0639).
NO NATO
NO DGES
DS Docta Complutense
RD 8 may 2024