TY  - JOUR
AU  - Piqueras De Noriega, Francisco Javier
AU  - Méndez Martín, María Bianchi
AU  - Plugaru, R.
AU  - Craciun, G.
AU  - García, J. A.
AU  - Remon, A.
PY  - 1999
DO  - 10.1007/s003390050897
SN  - 0947-8396
UR  - https://hdl.handle.net/20.500.14352/58945
T2  - Applied physics A-Materials Science&Processing
AB  - Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show a dominant band at 400 nm as well as a band centered at about 650 nm. CL spectra of porous...
LA  - eng
M2  - 329
PB  - Springer
KW  - Luminescence Properties
KW  - Photoluminescence
KW  - Emission
KW  - Si
TI  - Cathodoluminescence from nanocrystalline silicon films and porous silicon
TY  - journal article
VL  - 68
ER  -