TY  - JOUR
AU  - Fiorenza, Patrick
AU  - Lo Nigro, Raffaella
AU  - Raineri, Vito
AU  - Schmidt, Rainer
AU  - Sinclair, Derek
PY  - 2010
DO  - 10.1088/1757-899X/8/1/012038
SN  - 1757-8981
UR  - https://hdl.handle.net/20.500.14352/44709
T2  - IOP Conference Series: Materials Science and Engineering
AB  - Scanning probe microscopy (SPM) with conductive tips has been used to image the dielectric properties of ceramics with giant permittivity. In particular, measurements in impedance mode of local resistivity allowed to image thepermittivity map on...
LA  - eng
PB  - IOP Publishing
TI  - Probing dielectric ceramics surface at sub-micrometer scale
TY  - journal article
VL  - 8
ER  -