TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Jaenada Malagón, María
AU  - Pardo Llorente, Leandro
PY  - 2022
UR  - https://hdl.handle.net/20.500.14352/71975
AB  - One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is before the test time. Some kind of one-shot units do not get destroyed when tested, and then survival units can continue...
LA  - eng
KW  - Accelerated life tests
KW  - Density Power Divergence
KW  - One-shot devices
KW  - Robustness
TI  - Robust Rao-type tests for non-destructive one-shot device testing under step-stress model with exponential lifetimes
TY  - journal article
ER  -