TY  - JOUR
AU  - Cremades Rodríguez, Ana Isabel
AU  - Albrecht, M.
AU  - Krinke, J.
AU  - Dimitrov, R.
AU  - Stutzmann, M.
AU  - Strunk, H. P.
PY  - 2000
DO  - 10.1063/1.372187
SN  - 0021-8979
UR  - https://hdl.handle.net/20.500.14352/58819
T2  - Journal of Applied Physics
AB  - Combined electron beam induced current and transmission electron microscopy (TEM) measurements have been performed on both undoped and Si-doped AlGaN epitaxial films with aluminum contents x ranging from x = 0 to x = 0.79, in order to correlate the...
LA  - eng
M2  - 2357
PB  - American Institute of Physics
KW  - N-Type Gan
KW  - Chemical-Vapor-Deposition
KW  - Persistent Photoconductivity
KW  - Yellow Luminescence
KW  - Quantum-Wells
KW  - Heterostructures
KW  - Relaxation
KW  - Lifetime
KW  - Centers
TI  - Effects of phase separation and decomposition on the minority carrier diffusion length in AlxGa1-xN films
TY  - journal article
VL  - 87
ER  -