RT Journal Article
T1 Classification of surface structures on fine metallic wires
A1 Bernabeu Martínez, Eusebio
A1 Sánchez Brea, Luis Miguel
A1 Siegmann, Philip
A1 Martínez Antón, Juan Carlos
A1 Gómez Pedrero, José Antonio
A1 Wilkening, Günter
A1 Koenders, Ludger
A1 Müller, Franz
A1 Hildebrand, M.
A1 Hermann, Harti
AB In this report a classification of the main surface structures found on fine metallic wires is carried out (between ∼20 and 500 μm in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and production environments by scanning electron microscopy, atomic force microscopy, and confocal microscopy. A description and the images of the structures is given and, in addition, a nomenclature to be used by manufacturers, customers and researches is proposed. With this information the surface quality of fine metallic wires may be improved in a fabrication level. One of the objectives of this catalogue of defects is to serve as a basis for measuring the quality of the surface of the wires during the production process and the development of a measuring device for that purpose.
PB Elsevier Science B. V.
SN 0169-4332
YR 2001
FD 2001-08-16
LK https://hdl.handle.net/20.500.14352/59221
UL https://hdl.handle.net/20.500.14352/59221
LA eng
NO [1]  W.G. Drossel, M. Hildebrand, O. Pawelski. FEM-analysis of the friction process in section drawing. Steel Res., 69 (8) (1998), pp. 330–333. [2] M. Hildebrand. Die bedeutung der schmierstoffe für die vorgänge in der wirkfuge und der beanspruchung der werkzeuge beim ziehen EuroWire, 2 (3) (1999), pp. D12–D16.[3] M. Hildebrand, H. Hermann, Die wechselwirkungen von lokaler schmierfilmausbildung und örtlicher oberflächenfeingestalt bei der kaltumformung, DFG-Abschlußbericht, Institut für Metallformung der TU Bergakademie Freiberg, November 2000. [4] G. Binnig, C.F. Quate, Ch. Gerber Atomic force microscope Phys. Rev. Lett., 56 (9) (1986), pp. 930–933. [5] S. Gómez, K. Hale, J. Burrows, B. Griffiths Measurements of surface defects on optical components Meas. Sci. Technol., 9 (1998), pp. 607–616. [6] L. M. Sánchez-Brea, J. A. Gómez-Pedrero, E. Bernabeu. Measurement of surface defects on thin steel wires by atomic force microscopy. Appl. Surf. Sci., 150 (1–4) (1999), pp. 125–130. [7] L. M. Sánchez-Brea, J. A. Gómez-Pedrero, E. Bernabeu, Analysis and characterization of surface defects on thin steel wires by atomic force microscopy, in: Proceedings of the Wire and Cable Technical Symposium at Interwire ’99, Wire Association International, Atlanta, 1999, pp. 189–192.
NO © Elsevier Science B.V.This work has been supported by European Union within the frame of the EU Research Program “Standards Measurement and Testing”, project SMT4-CT97-2184 “DEFCYL: Detection of DEFects in CYLindrical surfaces”.
NO Unión Europea (UE)
DS Docta Complutense
RD 7 may 2024