TY  - JOUR
AU  - Clemente Barreira, Juan Antonio
AU  - Rezaei, Mohammadreza
AU  - Franco Peláez, Francisco Javier
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/65264
T2  - IEEE Transactions on Nuclear Science
AB  - Modern nanoscale devices with storage capacity typically implement error correction codes (ECCs) in order to cope with the effects of natural radiation. Thus, different state-of-the-art ECC techniques aim at preventing data corruption when different...
LA  - eng
M2  - 169
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Single Event Effects
KW  - Multiple Bit Upsets
KW  - Error Correction Codes
KW  - SRAM
TI  - Reliability of Error Correction Codes Against Multiple Events by Accumulation
TY  - journal article
VL  - 69
ER  -