RT Journal Article
T1 Study of defects in chemical-vapor-deposited diamond films by cross-sectional cathodoluminescence
A1 Cremades Rodríguez, Ana Isabel
A1 Domínguez-Adame Acosta, Francisco
A1 Piqueras De Noriega, Francisco Javier
AB Cathodoluminescence (CL) in the scanning electron microscope has been used to study the upper surface and cross-sectional samples of chemical vapor deposited diamond films. The CL emission is mainly localized at the grain boundaries of the columnar grains. The concentration of dislocation related radiative centers is higher in boundaries parallel to the growth axis than in boundaries parallel to the sample surface. The opposite occurs with the concentration of centers related to the presence of nitrogen.
PB American Institute of Physics
SN 0021-8979
YR 1993
FD 1993-11-01
LK https://hdl.handle.net/20.500.14352/58865
UL https://hdl.handle.net/20.500.14352/58865
LA eng
NO © 1993 American Institute of Physics.This work has been supported by DGICYT (Project PB-1017). Thanks are due to Dr. E. Wolfgang for drawing our attention to the CL cross sectional measurements.
NO DGICYT (Spain)
DS Docta Complutense
RD 21 abr 2025