RT Journal Article
T1 Talbot effect in metallic gratings under Gaussian illumination
A1 Sánchez Brea, Luis Miguel
A1 Torcal Milla, Francisco José
A1 Bernabeu Martínez, Eusebio
AB Metallic gratings can be found in applications such as optical metrology. Due to their fabrication process, the surface presents a certain roughness. In this work, the effect of roughness on Talbot effect has been analyzed when the grating is illuminated with a Gaussian beam. A model based on Fresnel regime is used in order to determine the intensity distribution in the near field. Contrast of the self-images is obtained and it is found that it decreases in terms of the distance between the grating and the observation plane. When the autocorrelation function of roughness presents a Gaussian behaviour, the diffracted beams are still Gaussian although some of their properties change. For example, the width of the diffracted beams increases with respect to the case of the standard chrome on glass gratings. On the other hand, the power of each diffracted beam is independent on the roughness properties of the surface.
PB Elsevier Science BV
SN 0030-4018
YR 2007
FD 2007-10-01
LK https://hdl.handle.net/20.500.14352/51177
UL https://hdl.handle.net/20.500.14352/51177
LA eng
NO [1] W.H.F. Talbot, Philos. Mag. 9 (1836) 401.[2] K. Patorski, Prog. Optics 27 (1989) 1.[3] E. Keren, O. Kafri, J. Opt. Soc. Am. A 2 (2) (1985) 111.[4] A.W. Lohmann, D.E. Silva, Opt. Commun. 2 (1971) 413.[5] G. Schirripa Spagnolo, D. Ambrosini, D. Paoletti, J. Opt. A: Pure Appl. Opt. 4 (2002) S376.[6] B.F. Oreb, R.G. Dorsch, Appl. Opt. 33 (1994) 7955.[7] S. Wei, S. Wu, I. Kao, F.P. Chiang, Trans. ASME J. Electron. Packag. 120 (1998) 166.[8] S. Szapiel, K. Patorski, Opt. Acta 26 (4) (1979) 439.[9] P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces, Artech House, 1987.[10] J.W. Goodman, Statistical Optics, John Wiley & Sons, New York, 1985.[11] J.C. Dainty, Laser Speckle and Related Phenomena, Springer-Verlag, 1984.[12] J.A. Ogilvy, Theory of Wave Scattering from Random Rough Surfaces, IOP, 1991.[13] F. Pérez-Quintián, A. Lutenberg, M.A. Rebollo, Appl. Opt. 45 (20) (2006) 4821.[14] V.Ya. Mendeleev, S.N. Skovorod’ko, Optics and Spectroscopy 94 (3) (2003) 437.[15] V. Celli, A.A. Maradudin, A.M. Marvin, A.R. McGurn, J. Opt. Soc. Am. A 2 (12) (1985) 2225.[16] B.E.A. Saleh, M.C. Teich, Fundamentals of Photonics, John Wiley & Sons, 1991.
NO © 2007 Elsevier B.V.This work has been supported by the DPI2005-02860 project of the Ministerio de Educación y Ciencia of Spain and the “Tecnologías en ecología, alta precisión y productividad, multifuncionalidad, y tecnologías de la información y comunicaciones en Máquina Herramienta” CENIT project of the Ministerio de Industria, turismo y comercio. Sánchez-Brea is currently contracted by the Universidad Complutense de Madrid under the “Ramón y Cajal” research program of the Ministerio de Educación y Ciencia of Spain.
NO Ministerio de Educación y Ciencia (MEC), España
NO Ministerio de Industria, Turismo y Comercio, España
NO Universidad Complutense de Madrid (UCM)
DS Docta Complutense
RD 4 may 2024