TY  - JOUR
AU  - Nogales Díaz, Emilio
AU  - Méndez Martín, María Bianchi
AU  - Piqueras De Noriega, Francisco Javier
AU  - Plugaru, R
PY  - 2003
DO  - 10.1088/0957-4484/14/1/315
SN  - 0957-4484
UR  - https://hdl.handle.net/20.500.14352/50969
T2  - Nanotechnology
AB  - Nanocrystalline silicon films, with an average nanocrystal size of about 10 nm, obtained by boron implantation of amorphous silicon layers, have been studied by remote-beam-induced current (REBIC) in a scanning tunnelling microscope (STM) and by...
LA  - eng
M2  - 65
PB  - Iop Publishing Ltd
KW  - Luminescence Properties
KW  - Tunneling-Microscopy
KW  - Porous Silicon
KW  - States
TI  - Electrical characterization of nanocrystalline Si films by scanning tunnelling spectroscopy and beam-induced current in the scanning tunnelling microscope
TY  - journal article
VL  - 14
ER  -