TY  - JOUR
AU  - Montero Álvarez, Daniel
AU  - Caudevilla Gutiérrez, Daniel
AU  - Algaidy, Sari
AU  - García Hernansanz, Rodrigo
AU  - Suler, Andrej
AU  - Acosta Alba, Pablo
AU  - Kerdiles, Sébastien
AU  - Pastor Pastor, David
AU  - García Hemme, Eric
AU  - Roy, Francois
AU  - Olea Ariza, Javier
PY  - 2023
DO  - 10.1088/1361-6641/acb16d
SN  - 0268-1242
UR  - https://hdl.handle.net/20.500.14352/88804
T2  - Semiconductor Science and Technology
AB  - Hyperdoped or supersaturated semiconductors are gathering the attention of industry and research institutions due to their sub-bandgap photon absorption properties. In this study, two fast and non-invasive techniques, time-resolved reflectometry (TRR)...
LA  - eng
PB  - IOP Publishing
KW  - Nanosecond laser annealing
KW  - Silicon supersaturation
KW  - Silicon recrystallization
KW  - Time-resolved reflectometry
KW  - Haze measurements
TI  - Estimation of the melting threshold of Ti supersaturated Si using time resolved reflectometry and haze measurements
TY  - journal article
VL  - 38
ER  -