TY  - JOUR
AU  - Clemente Barreira, Juan Antonio
AU  - Hubert, Guillaume
AU  - Rezaei, Mohammadreza
AU  - Franco Peláez, Francisco Javier
AU  - Mecha López, Hortensia
PY  - 2021
DO  - 10.1109/TNS.2021.3099202
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/4418
T2  - IEEE Transactions on Nuclear Science
AB  - This paper presents an analysis of the multiple events (and more specifically, Multiple Cell Upsets or MCUs) that may occur at successive generations of bulk CMOS SRAMs operating under harsh conditions, such as in avionics or space. Such MCU...
LA  - eng
PB  - IEEE-Inst Electrical Electronics Engineers Inc
TI  - Impact of the Bitcell Topology on the Multiple Cell Upsets Observed in VLSI Nanoscale SRAMs
TY  - journal article
ER  -