%0 Book Section
%T Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
publisher IEEE-Inst Electrical Electronics Engineers Inc
%D 2015
%U 978-1-5090-0232-0
%@ https://hdl.handle.net/20.500.14352/24710
%X This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
%~