RT Book, Section
T1 Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
T2 Anomalías estadísticas de los bits corruptos en memorias estáticas de acceso aleatorio para distinguir eventos múltiples de simples.
A1 Clemente Barreira, Juan Antonio
A1 Franco Peláez, Francisco Javier
A1 Villa, Francesca
A1 Rey, Sole
A1 Baylac, Maud
A1 Mecha López, Hortensia
A1 Agapito Serrano, Juan Andrés
A1 Puchner, Helmut
A1 Hubert, Guillaume
A1 Velazco, Raoul
AB This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 978-1-5090-0232-0
YR 2015
FD 2015-09-18
LK https://hdl.handle.net/20.500.14352/24710
UL https://hdl.handle.net/20.500.14352/24710
LA eng
NO ©IEEE 2015European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015) (15. 2015. Moscú).Date of Conference: 14-18 Sept. 2015
NO Ministerio de Economía y Competitividad (MINECO)
NO UCM-BSCH
NO Programa "José Castillejo" para movilidad de profesores
DS Docta Complutense
RD 9 abr 2025