RT Journal Article
T1 Power divergence approach for one-shot device testing under competing risks
A1 Balakrishnan, Narayanaswamy
A1 Castilla González, Elena María
A1 Martín Apaolaza, Nirian
A1 Pardo Llorente, Leandro
AB Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust estimators and Wald-type tests are developed here for the case of one-shot devices under competing risks. An extensive simulation study illustrates the robustness of these divergence-based estimators and test procedures based on them. A data-driven procedure is proposed for choosing the optimal estimator for any given data set which is then applied to an example in the context of survival analysis.
PB Elsevier
SN 0377-0427
YR 2022
FD 2022-08-27
LK https://hdl.handle.net/20.500.14352/71936
UL https://hdl.handle.net/20.500.14352/71936
LA eng
NO Ministerio de Ciencia e Innovación (MICINN)
DS Docta Complutense
RD 8 jul 2025