TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Castilla González, Elena María
AU  - Martín Apaolaza, Nirian
AU  - Pardo Llorente, Leandro
PY  - 2022
DO  - 10.1016/j.cam.2022.114676
SN  - 0377-0427
UR  - https://hdl.handle.net/20.500.14352/71936
T2  - Journal of Computational and Applied Mathematics
AB  - Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust estimators and...
LA  - eng
PB  - Elsevier
KW  - One-shot devices
KW  - Robustness
KW  - Reliability
KW  - Minimum DPD estimators
KW  - Wald-type tests
TI  - Power divergence approach for one-shot device testing under competing risks
TY  - journal article
VL  - 419
ER  -