TY  - CHAP
AU  - Franco Peláez, Francisco Javier
AU  - Velazco, Raoul
PY  - 2007
DO  - 10.1109/SCED.2007.384018
SN  - 1-4244-0868-7
UR  - https://hdl.handle.net/20.500.14352/53413
AB  - This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in...
LA  - eng
M2  - 165
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - SRAM chips
KW  - Logic testing
KW  - Radiation effects
KW  - Sensitivity
KW  - SEU evaluation board
KW  - SRAM
KW  - Cosmic ray interaction
KW  - Field test system
KW  - Natural radiation effects
KW  - Single event upset
KW  - Atmosphere
KW  - Cosmic rays
KW  - Field programmable gate arrays
KW  - Laboratories
KW  - Microprocessors
KW  - Neutrons
KW  - Performance evaluation
KW  - Random access memory
KW  - System testing
KW  - SRAMs
KW  - Single event effects
KW  - Soft error rate
TI  - A portable low-cost SEU evaluation board for SRAMs
TY  - book part
ER  -