TY  - JOUR
AU  - Cremades Rodríguez, Ana Isabel
AU  - Albrecht, M.
AU  - Voigt, A.
AU  - Krinke, J.
AU  - Dimitrov, R.
AU  - Ambacher, O.
AU  - Stutzmann, M.
PY  - 1998
SN  - 1012-0394
UR  - https://hdl.handle.net/20.500.14352/58847
T2  - Solid State Phenomena
AB  - Combined electron beam induced current and transmission electron microscopy measurements have been performed on both undoped and Si-doped AlGaN epitaxial films with aluminium contents x ranging from x=0 to x=0.79. TEM analysis shows the distribution...
M2  - 139
PB  - Trans Tech-Scitec Publications LDT
KW  - Gan
KW  - Lifetime. Dynamics
TI  - Minority carrier diffusion length in AlGaN: A combined electron beam induced current and transmission microscopy
TY  - journal article
VL  - 63-4
ER  -