TY  - CONF
AU  - Zong, Yi
AU  - Franco Peláez, Francisco Javier
AU  - Hernández Cachero, Antonio
AU  - Agapito Serrano, Juan Andrés
AU  - Fernandes, Ana C.
AU  - Marques, José G.
AU  - Rodríguez-Ruiz, Miguel Ángel
AU  - Casas-Cubillos, Juan
PY  - 2005
UR  - https://hdl.handle.net/20.500.14352/53994
AB  - This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period...
LA  - eng
M2  - 132
KW  - Gamma-ray effects
KW  - Hysteresis
KW  - Integrated circuit testing
KW  - Microprocessor chips
KW  - Neutron effects
KW  - Reference circuits
KW  - TTL trigger level shift
KW  - Microprocessor supervisory circuits
KW  - Mixed neutron-gamma radiation environment
KW  - Supply current increase
KW  - Threshold voltage hysteresis
KW  - Watchdog timer
KW  - Circuit testing
KW  - Clocks
KW  - Cryogenics
KW  - Field programmable gate arrays
KW  - Gamma rays
KW  - Inductors
KW  - Large Hadron Collider
KW  - Microprocessors
KW  - Neutrons
KW  - Threshold voltage
TI  - Supervisory circuits in a mixed neutron and gamma radiation environment
TY  - conference poster
ER  -