TY  - JOUR
AU  - Clemente Barreira, Juan Antonio
AU  - Franco Peláez, Francisco Javier
AU  - Villa, Francesca
AU  - Baylac, Maud
AU  - Rey, Solenne
AU  - Mecha López, Hortensia
AU  - Agapito Serrano, Juan Andrés
AU  - Puchner, Helmut
AU  - Hubert, Guillaume
AU  - Velazco, Raoul
PY  - 2016
DO  - 10.1109/TNS.2016.2551263
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/18959
T2  - IEEE Transactions on Nuclear Science
AB  - Recently, the occurrence of multiple events in static tests has been investigated by checking the statistical distribution of the difference between the addresses of the words containing bitflips. That method has been successfully applied to Field...
LA  - eng
M2  - 2087
PB  - IEEE
KW  - SRAMs
KW  - Single event upsets
KW  - Multiple cell upsets
KW  - Neutron tests
TI  - Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs
TY  - journal article
VL  - 63
ER  -