RT Journal Article
T1 Divergence-based robust inference under proportional hazards model for one-shot device life-test
A1 Balakrishnan, Narayanaswamy
A1 Castilla González, Elena María
A1 Martín, N
A1 Pardo Llorente, Leandro
AB In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo simulation study and a numerical example, the developed inferential procedures are shown to be more robust than the classical procedures, based on maximum likelihood estimators.
PB Institute of Electrical and Electronics Engineers
SN 0018-9529
YR 2021
FD 2021
LK https://hdl.handle.net/20.500.14352/7278
UL https://hdl.handle.net/20.500.14352/7278
LA eng
DS Docta Complutense
RD 22 ago 2024