TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Castilla González, Elena María
AU  - Martín, N
AU  - Pardo Llorente, Leandro
PY  - 2021
DO  - 10.1109/TR.2021.3062289
SN  - 0018-9529
UR  - https://hdl.handle.net/20.500.14352/7278
T2  - IEEE Transactions on Reliability
AB  - In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo simulation study and a numerical example, the developed inferential...
LA  - eng
M2  - 1355
PB  - Institute of Electrical and Electronics Engineers
KW  - Monte-carlo simulation
KW  - Mathematical statistics
TI  - Divergence-based robust inference under proportional hazards model for one-shot device life-test
TY  - journal article
VL  - 70
ER  -