TY  - JOUR
AU  - Gazquez, Jaume
AU  - Sánchez Santolino, Gabriel
AU  - Biskup Zaja, Nevenko
AU  - Roldan, Manuel A.
AU  - Cabero Piris, Mariona
AU  - Pennycook, Stephen J.
AU  - Varela Del Arco, María
PY  - 2017
DO  - 10.1016/j.mssp.2016.06.005
SN  - 1369-8001
UR  - https://hdl.handle.net/20.500.14352/104615
T2  - Materials Science in Semiconductor Processing
AB  - In this chapter we will review a few examples of applications of atomic resolution aberration corrected scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS) to complex oxide materials. These are most...
LA  - eng
M2  - 49
PB  - Elsevier
KW  - Electron microscopy
KW  - STEEM
KW  - EELS
KW  - Complex oxides
KW  - Interfaces
TI  - Applications of STEM-EELS to complex oxides
TY  - journal article
VL  - 65
ER  -