TY  - JOUR
AU  - Franco Peláez, Francisco Javier
AU  - Zong, Yi
AU  - Agapito Serrano, Juan Andrés
PY  - 2006
DO  - 10.1109/TNS.2006.880474
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/51321
T2  - IEEE transactions on nuclear science
AB  - Radiation tests have shown the existence of inactivity windows in analog switches. It means that the devices lose their ability to switch between ON and OFF states if the total radiation dose is placed between two characteristic values. Once the total...
LA  - eng
M2  - 1923
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - CMOS analogue integrated circuits
KW  - Field effect transistor switches
KW  - Radiation effects
KW  - Semiconductor device testing
KW  - CMOS analog switch
KW  - NMOS transistor irradiation
KW  - Inactivity windows
KW  - On-off state
KW  - Physical mechanism
KW  - Radiation testing
KW  - Total ionizing dose
KW  - Electron accelerators
KW  - Instruments
KW  - Ion accelerators
KW  - Ionizing radiation
KW  - Large Hadron Collider
KW  - Neutrons
KW  - Particle beams
KW  - Superconducting magnets
KW  - Switches
KW  - Testing
KW  - Analog switches
KW  - Complementary metal
KW  - Oxide semiconductor (CMOS) devices
KW  - Total ionizing dose (TID)
TI  - Inactivity windows in irradiated CMOS analog switches
TY  - journal article
VL  - 53
ER  -