TY  - JOUR
AU  - Ramírez, J. G.
AU  - Schmidt, Rainer
AU  - Sharoni, A.
AU  - Gómez, M. E.
AU  - Schuller, Ivan K.
AU  - Patiño, Edgar J.
PY  - 2013
DO  - 10.1063/1.4792052
SN  - 0003-6951
UR  - https://hdl.handle.net/20.500.14352/34809
T2  - Applied physics letters
AB  - Temperature dependent dielectric spectroscopy measurements on vanadium dioxide thin films allow us to distinguish between the resistive, capacitive, and inductive contributions to the impedance across the metal-insulator transition (MIT). We developed...
LA  - eng
PB  - American Institute of Physics
KW  - Vanadium dioxide
KW  - Film.
TI  - Ultra-thin filaments revealed by the dielectric response across the metal-insulator transition in VO_(2)
TY  - journal article
VL  - 102
ER  -