2026-06-29T02:43:48Zhttps://docta.ucm.es/rest/oai/request

oai:docta.ucm.es:20.500.14352/1043932025-09-04T17:56:43Zcom_20.500.14352_14col_20.500.14352_15

Interferometric method for simultaneous characterization of retardance and fast axis of a retarder Del Hoyo Muñoz, Jesús Porras, Joaquin Andres Soria García, Ángela Sánchez Brea, Luis Miguel Pastor Villarrubia, Veronica Hamdy Mohamed Elshorbagy, Mahmoud Alda Serrano, Javier In this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2◦ for the retardance and 1◦ for the azimuth of the fast axis. 2024-05-23T18:37:25Z 2024-05-23T18:37:25Z 2024-05-23T18:37:25Z 2024 journal article https://hdl.handle.net/20.500.14352/104393 0143-8166 10.1016/j.optlaseng.2024.108262 1873-0302 eng info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-105918GB-I00/ES/NANOFOTONICA CON MICROOPTICA: OPTICA RESONANTE PARA SISTEMAS MICROOPTICOS/ info:eu-repo/grantAgreement/AEI/Proyectos de Generación de Conocimiento 2022/PID2022-138071OB-I00/ES/Elementos opticos difractivos vectoriales para ciencia y tecnología/VDOEST Del Hoyo, Jesus, et al. «Interferometric Method for Simultaneous Characterization of Retardance and Fast Axis of a Retarder». Optics and Lasers in Engineering, vol. 179, agosto de 2024, p. 108262. https://doi.org/10.1016/j.optlaseng.2024.108262. http://creativecommons.org/licenses/by/4.0/ open access Attribution 4.0 International Elsevier