<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-06-07T16:54:08Z</responseDate><request verb="GetRecord" identifier="oai:docta.ucm.es:20.500.14352/33825" metadataPrefix="qdc">https://docta.ucm.es/rest/oai/request</request><GetRecord><record><header><identifier>oai:docta.ucm.es:20.500.14352/33825</identifier><datestamp>2023-08-25T13:09:42Z</datestamp><setSpec>com_20.500.14352_14</setSpec><setSpec>col_20.500.14352_15</setSpec></header><metadata><qdc:qualifieddc xmlns:qdc="http://dspace.org/qualifieddc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://purl.org/dc/elements/1.1/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dc.xsd http://purl.org/dc/terms/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dcterms.xsd http://dspace.org/qualifieddc/ http://www.ukoln.ac.uk/metadata/dcmi/xmlschema/qualifieddc.xsd">
   <dc:title>Characteristics of the long duration pulses in a shunt linear voltage regulator</dc:title>
   <dc:creator>Palomar Trives, Carlos</dc:creator>
   <dc:creator>Franco Peláez, Francisco Javier</dc:creator>
   <dc:creator>González Izquierdo, Jesús</dc:creator>
   <dc:creator>López Calle, Isabel</dc:creator>
   <dc:creator>Agapito Serrano, Juan Andrés</dc:creator>
   <dcterms:abstract>Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 μ s ) in these devices, which is eventually demonstrated using a pulsed laser facility. Data issued from these tests helps to understand how the electrical network parameters as well as the non-idealities of the devices affect the characteristics of the transients. Finally, this phenomenon is investigated in similar structures with identical purpose.</dcterms:abstract>
   <dcterms:dateAccepted>2023-06-19T13:28:50Z</dcterms:dateAccepted>
   <dcterms:available>2023-06-19T13:28:50Z</dcterms:available>
   <dcterms:created>2023-06-19T13:28:50Z</dcterms:created>
   <dcterms:issued>2014-02-11</dcterms:issued>
   <dc:type>journal article</dc:type>
   <dc:identifier>https://hdl.handle.net/20.500.14352/33825</dc:identifier>
   <dc:identifier>0168-9002</dc:identifier>
   <dc:identifier>10.1016/j.nima.2013.11.083</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>AYA2009-13300-C03-02/03</dc:relation>
   <dc:relation>Consolider SAUUL CSD2007-00013</dc:relation>
   <dc:rights>open access</dc:rights>
   <dc:publisher>Elsevier Science BV</dc:publisher>
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