<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-06-08T06:53:27Z</responseDate><request verb="GetRecord" identifier="oai:docta.ucm.es:20.500.14352/33825" metadataPrefix="rdf">https://docta.ucm.es/rest/oai/request</request><GetRecord><record><header><identifier>oai:docta.ucm.es:20.500.14352/33825</identifier><datestamp>2023-08-25T13:09:42Z</datestamp><setSpec>com_20.500.14352_14</setSpec><setSpec>col_20.500.14352_15</setSpec></header><metadata><rdf:RDF xmlns:rdf="http://www.openarchives.org/OAI/2.0/rdf/" xmlns:ow="http://www.ontoweb.org/ontology/1#" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:ds="http://dspace.org/ds/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/rdf/ http://www.openarchives.org/OAI/2.0/rdf.xsd">
   <ow:Publication rdf:about="oai:docta.ucm.es:20.500.14352/33825">
      <dc:title>Characteristics of the long duration pulses in a shunt linear voltage regulator</dc:title>
      <dc:creator>Palomar Trives, Carlos</dc:creator>
      <dc:creator>Franco Peláez, Francisco Javier</dc:creator>
      <dc:creator>González Izquierdo, Jesús</dc:creator>
      <dc:creator>López Calle, Isabel</dc:creator>
      <dc:creator>Agapito Serrano, Juan Andrés</dc:creator>
      <dc:description>© 2014 Elsevier.</dc:description>
      <dc:description>Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 μ s ) in these devices, which is eventually demonstrated using a pulsed laser facility. Data issued from these tests helps to understand how the electrical network parameters as well as the non-idealities of the devices affect the characteristics of the transients. Finally, this phenomenon is investigated in similar structures with identical purpose.</dc:description>
      <dc:date>2023-06-19T13:28:50Z</dc:date>
      <dc:date>2023-06-19T13:28:50Z</dc:date>
      <dc:date>2014-02-11</dc:date>
      <dc:type>journal article</dc:type>
      <dc:identifier>0168-9002</dc:identifier>
      <dc:identifier>10.1016/j.nima.2013.11.083</dc:identifier>
      <dc:identifier>https://hdl.handle.net/20.500.14352/33825</dc:identifier>
      <dc:identifier>http://www.sciencedirect.com/science/article/pii/S0168900213016483</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:relation>AYA2009-13300-C03-02/03</dc:relation>
      <dc:relation>Consolider SAUUL CSD2007-00013</dc:relation>
      <dc:rights>open access</dc:rights>
      <dc:publisher>Elsevier Science BV</dc:publisher>
   </ow:Publication>
</rdf:RDF></metadata></record></GetRecord></OAI-PMH>