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      <dc:title>Dynamics and Electrooptics of Vertically Aligned
Nematics With Induced Pretilt on SiOx</dc:title>
      <dc:creator>Otón Martínez, Eva</dc:creator>
      <dc:creator>López De Andrés, María Sol</dc:creator>
      <dc:creator>Carrasco Vela, Carlos</dc:creator>
      <dc:creator>Cerrolaza, Beatriz</dc:creator>
      <dc:creator>Bennis, Noureddine</dc:creator>
      <dc:creator>Otón Sánchez, José Manuel</dc:creator>
      <dc:description>The response time and contrast of vertically-aligned
negative nematics depend critically on the aligning surface and its
induced pretilt. Pretilt can be tuned up using obliquely evaporated
inorganic oxides as alignment surface.
A thorough study of pretilt angles induced by aligning surfaces
of thermally evaporated SiO has been carried out on
several commercial and experimental negative nematic mixtures.
Morphology of SiO with different evaporation angles has been
studied by Field Emission Scanning Electron Microscopy. Some
morphological variations appear at specific evaporation angles.
These are related to the pretilt induced by the surface and to the
dynamic response of the device.</dc:description>
      <dc:date>2023-06-20T00:08:58Z</dc:date>
      <dc:date>2023-06-20T00:08:58Z</dc:date>
      <dc:date>2010</dc:date>
      <dc:type>journal article</dc:type>
      <dc:identifier>1551-319X</dc:identifier>
      <dc:identifier>10.1109/JDT.2010.2049730</dc:identifier>
      <dc:identifier>https://hdl.handle.net/20.500.14352/42085</dc:identifier>
      <dc:identifier>http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9425</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:rights>open access</dc:rights>
      <dc:publisher>Institute of Electrical and Electronics Engineers.</dc:publisher>
   </ow:Publication>
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