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00925njm 22002777a 4500 dc Piqueras De Noriega, Francisco Javier author Cremades Rodríguez, Ana Isabel author Fernández Sánchez, Paloma author Méndez Martín, María Bianchi author 2009-04 0749-6036 10.1016/j.spmi.2008.11.016 https://hdl.handle.net/20.500.14352/43994 http://www.sciencedirect.com/science/journal/07496036/45/4-5 http://www.sciencedirect.com Proceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface