2026-06-26T05:14:29Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/439942024-09-09T17:00:50Zcom_20.500.14352_14col_20.500.14352_15
https://hdl.handle.net/20.500.14352/43994/ore.xml
2023-06-20T03:35:47Z
2023-06-20T03:35:47Z
Docta Complutense
Proceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface
Piqueras De Noriega, Francisco Javier
Cremades Rodríguez, Ana Isabel
Fernández Sánchez, Paloma
Méndez Martín, María Bianchi
2023-06-20T03:35:47Z
ORIGINAL
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THUMBNAIL