2026-06-26T10:56:31Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/447072023-08-27T14:23:19Zcom_20.500.14352_14col_20.500.14352_15
Ryu, Jungho
Park, Dong-Soo
Schmidt, Rainer
2023-06-20T03:56:45Z
2023-06-20T03:56:45Z
2011-06-01
0021-8979
10.1063/1.3592300
https://hdl.handle.net/20.500.14352/44707
http://dx.doi.org/10.1063/1.3592300
http://scitation.aip.org/
Temperature dependent in-plane impedance spectroscopy measurements were carried out in order to analyze the charge transport properties of functional oxide NiMn_(2)O_(4) negative temperature coefficient thermistor films deposited via aerosol deposition techniques onto glass and Al_(2)O_(3) substrates. The in-plane resistivity (ρ) versus temperature (T) curves of all films were uniform over a large temperature range (180 K to 500 K) and showed the typical exponential power-law behavior associated with variable-range hopping. The ρ-T dependences of annealed and as-deposited films exhibited power-law exponents ρ of about 0.6 and thermistor constants B in the range of 3500 K to 5000 K. As-deposited films showed higher ρ values as compared to annealed films. As-deposited films exhibited also increased B values, leading to increased sensitivity of the resistance to temperature changes, whereas annealed films deposited on Al_(2)O_(3) showed the lowest scatter in differentiated ρ-T data and might display superior reliability for temperature sensing applications.
eng
open access
In-plane impedance spectroscopy in aerosol deposited NiMn_(2)O_(4) negative temperature coefficient thermistor films
journal article