2026-08-20T06:03:36Zhttps://docta.ucm.es/rest/oai/request

oai:docta.ucm.es:20.500.14352/455482025-02-14T13:52:04Zcom_20.500.14352_14col_20.500.14352_21

00925njm 22002777a 4500 dc Franco Peláez, Francisco Javier author Palomar Trives, Carlos author Liu, Shih Fu author López Calle, Isabel author Maestro De La Cuerda, Juan Antonio author Agapito Serrano, Juan Andrés author 2011 Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc. 978-1-4577-0585-4 10.1109/RADECS.2011.6131375 https://hdl.handle.net/20.500.14352/45548 http://dx.doi.org/10.1109/RADECS.2011.6131375 http://ieeexplore.ieee.org/ Defining a strategy to perform life-tests with analog devices