2026-08-20T02:04:24Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/455482025-02-14T13:52:04Zcom_20.500.14352_14col_20.500.14352_21
Docta Complutense
author
Franco Peláez, Francisco Javier
author
Palomar Trives, Carlos
author
Liu, Shih Fu
author
López Calle, Isabel
author
Maestro De La Cuerda, Juan Antonio
author
Agapito Serrano, Juan Andrés
2023-06-20T05:46:38Z
2023-06-20T05:46:38Z
2011
978-1-4577-0585-4
10.1109/RADECS.2011.6131375
https://hdl.handle.net/20.500.14352/45548
http://dx.doi.org/10.1109/RADECS.2011.6131375
http://ieeexplore.ieee.org/
Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.
eng
Defining a strategy to perform life-tests with analog devices
book part
URL
https://docta.ucm.es/bitstreams/42f7b5e9-8c62-4b26-91ac-25a0d340245a/download
File
MD5
f5ba5029d254322f46778d10d436ea91
791288
application/pdf
LifeTests_on_SETS.pdf
URL
https://docta.ucm.es/bitstreams/28da7696-f86a-4b81-bfca-bc29e1313f5b/download
File
MD5
9ae42ccff82829da3051763de9c5fa66
31330
text/plain
LifeTests_on_SETS.pdf.txt