2026-06-26T16:51:43Zhttps://docta.ucm.es/rest/oai/request

oai:docta.ucm.es:20.500.14352/455482025-02-14T13:52:04Zcom_20.500.14352_14col_20.500.14352_21

Franco Peláez, Francisco Javier Palomar Trives, Carlos Liu, Shih Fu López Calle, Isabel Maestro De La Cuerda, Juan Antonio Agapito Serrano, Juan Andrés 2023-06-20T05:46:38Z 2023-06-20T05:46:38Z 2011 978-1-4577-0585-4 10.1109/RADECS.2011.6131375 https://hdl.handle.net/20.500.14352/45548 http://dx.doi.org/10.1109/RADECS.2011.6131375 http://ieeexplore.ieee.org/ Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc. eng open access Defining a strategy to perform life-tests with analog devices book part