2026-06-29T07:47:26Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/459202023-08-24T10:29:34Zcom_20.500.14352_14col_20.500.14352_20
Laser tests on a power operational amplifier
Palomar Trives, Carlos
López Calle, Isabel
Franco Peláez, Francisco Javier
González Izquierdo, Jesús
Agapito Serrano, Juan Andrés
537.8
Integrated circuit testing
Laser beam applications
Operational amplifiers
Power amplifiers
Radiation effects
Laser test
Power operational amplifier
Power system
Radiation environments
Single event transients
Junctions
Lasers
Power supplies
Resistors
Transient analysis
Transistors
Laser irradiation
OPA541
Power devices
Single-photon absorption
Electrónica (Física)
Óptica (Física)
Circuitos integrados
2209.19 Óptica Física
2203.07 Circuitos Integrados
©2011, IEEE
ISSN : 0379-6566
Print ISBN: 978-1-4577-0585-4
European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)
Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candidate to develop power systems to be used in radiation environments.
Ministerio de Educación y Ciencia
Depto. de Estructura de la Materia, Física Térmica y Electrónica
Depto. de Química Física
Fac. de Ciencias Físicas
Fac. de Ciencias Químicas
TRUE
pub
2023-06-20T06:04:08Z
2023-06-20T06:04:08Z
2011-09-19
conference paper
https://hdl.handle.net/20.500.14352/45920
XXXX-XXXX
eng
AYA2009-13300-C03-02
Consolider SAUUL CSD2007-00013
open access
application/pdf