2026-06-27T22:50:15Zhttps://docta.ucm.es/rest/oai/request

oai:docta.ucm.es:20.500.14352/512002023-08-27T04:25:39Zcom_20.500.14352_14col_20.500.14352_15

00925njm 22002777a 4500 dc Siegmann, Philip author Sánchez Brea, Luis Miguel author Martínez Antón, Juan Carlos author Bernabeu Martínez, Eusebio author 2004-11-15 Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical techniques have been developed to be used for those tasks. However, they need a rigorous validation. In this work, we have used confocal microscopy to obtain the topography z(x,y) of wires with longitudinal defects, such as dielines. The topography has been used to predict the light scattered by the wire. These simulations have been compared with experimental results, showing a good agreement. 0169-4332 10.1016/j.apsusc.2004.05.240 https://hdl.handle.net/20.500.14352/51200 http://dx.doi.org/10.1016/j.apsusc.2004.05.240 http://www.sciencedirect.com Comparison between optical techniques and confocal microscopy for defect detection on thin wires