2026-06-08T07:24:49Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/513272023-08-26T10:23:38Zcom_20.500.14352_14col_20.500.14352_15
Docta Complutense
author
Franco Peláez, Francisco Javier
author
Lozano Rogado, Jesús
author
Santos Blanco, José Pedro
author
Agapito Serrano, Juan Andrés
2023-06-20T10:50:46Z
2023-06-20T10:50:46Z
2003-12
0018-9499
10.1109/TNS.2003.820628
https://hdl.handle.net/20.500.14352/51327
http://dx.doi.org/10.1109/TNS.2003.820628
http://ieeexplore.ieee.org/
Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. The radiation tolerance is bigger in amplifiers with JFET input stage or with large frequency bandwidth and is smaller if the amplifier has been designed for reducing the power consumption. The IAs built with OPAMPs have a higher tolerance than the commercial ones, but they have disadvantages: high temperature influence, low CMRR, etc.
eng
Degradation of instrumentation amplifiers due to the nonionizing energy loss damage
journal article
URL
https://docta.ucm.es/bitstreams/de1a3db0-5703-4ea1-83ad-b9494f04d391/download
File
MD5
37f43b28a8d1dd01f7ea0f3577b0ea78
463771
application/pdf
TNS2003-Franco-UCM.pdf
URL
https://docta.ucm.es/bitstreams/e3db340a-9059-4251-a5d9-3529e5b8e78f/download
File
MD5
324ff15b3a1c3771f0886a5866988890
30531
text/plain
TNS2003-Franco-UCM.pdf.txt