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   <dc:title>XtremeFringe: state-of-the-art software for automatic processing of fringe patterns</dc:title>
   <dc:creator>Quiroga Mellado, Juan Antonio</dc:creator>
   <dc:creator>Crespo Vázquez, Daniel</dc:creator>
   <dc:creator>Gómez Pedrero, José Antonio</dc:creator>
   <dc:subject>535</dc:subject>
   <dc:subject>Quadrature Transform</dc:subject>
   <dc:subject>Phase</dc:subject>
   <dc:subject>Demodulation</dc:subject>
   <dc:subject>Óptica (Física)</dc:subject>
   <dc:subject>2209.19 Óptica Física</dc:subject>
   <dc:description>© (2007) SPIE--The International Society for Optical Engineering.
Conference on Optical Measurement Systems for Industrial Inspection (5ª. 2007. Múnich, Alemania).</dc:description>
   <dc:description>XtremeFringe is a new library for fringe pattern processing which incorporates modem methods for automatic analysis including fringe pattern demodulation, fringe pattern filtering and phase unwrapping methods. XtremeFringe (R) is written in C# and is usable as an assembly from any NET language (C#, C++, .NET, J#) and additionally as a Matlab toolbox, which ensures an easy adaptation in custom applications, providing the user with a versatile and powerful tool for fringe pattern analysis in a flexible way. The functions of XtremeFringe are suitable to be employed in metrological applications such interferometry, photoelasticity, Moire techniques, holography, etc. supplying the user with up-to-date fringe analysis tools. In this work, we demonstrate the capabilities of the XtremeFringe  library, processing different examples showing the ability of the library to analyze complex fringe patterns in a fast, reliable and automatic way.</dc:description>
   <dc:description>Depto. de Óptica</dc:description>
   <dc:description>Fac. de Ciencias Físicas</dc:description>
   <dc:description>TRUE</dc:description>
   <dc:description>pub</dc:description>
   <dc:date>2023-06-20T13:39:52Z</dc:date>
   <dc:date>2023-06-20T13:39:52Z</dc:date>
   <dc:date>2007</dc:date>
   <dc:type>book part</dc:type>
   <dc:identifier>https://hdl.handle.net/20.500.14352/53283</dc:identifier>
   <dc:identifier>XXXX-XXXX</dc:identifier>
   <dc:identifier>10.1117/12.725670</dc:identifier>
   <dc:relation>Proceedings Of The Society Of Photo-Optical Instrumentation Engineers (SPIE)</dc:relation>
   <dc:rights>metadata only access</dc:rights>
   <dc:publisher>SPIE--The International Society for Optical Engineering</dc:publisher>
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