2026-06-29T08:02:26Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/533902024-10-09T15:37:01Zcom_20.500.14352_14col_20.500.14352_21
Radiation effects on XFET voltage references
Franco Peláez, Francisco Javier
Zong, Yi
Agapito Serrano, Juan Andrés
Hernandez Cachero, Antonio
537.8
JFET circuits
Gamma-ray effects
Neutron effects
Operational amplifiers
Reference circuits
COTS devices
XFET voltage references
gamma environment
neutron environment
operational amplifiers
p-channel junction field effect transistors
radiation effects
radiation-tolerant electronic systems
reference cells
FETs
Inductors
Instruments
Neutrons
Output feedback
Photonic band gap
Radiation effects
Stability
Voltage
Electrónica (Física)
Radiactividad
© IEEE
IEEE Radiation Effects Data Workshop (2005. Seattle, WA).
This work was supported by the collaboration agreement
K476/LHC between CERN and UCM, by the Spanish Research
Agency CICYT (FPA2002-00912) and partially supported by ITN.
XFET references make up a new kind of voltage references different from the popular band-gap or buried Zener devices. These references are built by means of a reference cell consisting of a couple of p-channel junction field effect transistors with different pinch-off voltage values and an operational amplifier for the purpose of improving the output characteristics of the whole device. An irradiation in a mixed gamma and neutron environment was performed at the Portuguese Research Reactor for a complete characterization of the devices. Some of the parameters were measured during the irradiation while the rest of them were obtained once the samples were removed from the neutron facility. Experimental results show that some references belonging to this class are interesting candidates for a design of radiation-tolerant electronic systems based on COTS devices.
Ministerio de Educación y Ciencia
CERN
Universidad Complutense de Madrid
CICYT
ITN (Portugal)
Depto. de Estructura de la Materia, Física Térmica y Electrónica
Fac. de Ciencias Físicas
TRUE
pub
2023-06-20T13:41:20Z
2023-06-20T13:41:20Z
2005-07-11
book part
https://hdl.handle.net/20.500.14352/53390
XXXX-XXXX
10.1109/REDW.2005.1532680
eng
FPA2002-00912
K476/LHC
open access
application/pdf
IEEE-Inst Electrical Electronics Engineers Inc