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00925njm 22002777a 4500 dc Zong, Yi author Franco Peláez, Francisco Javier author Agapito Serrano, Juan Andrés author 2004-09-22 The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages. 84-930056-1-4 https://hdl.handle.net/20.500.14352/53399 http://www.inta.es Using optimization techniques to characterize irradiated CMOS analog switches