2026-06-08T13:38:37Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/533992023-09-07T15:35:47Zcom_20.500.14352_14col_20.500.14352_21
Docta Complutense
author
Zong, Yi
author
Franco Peláez, Francisco Javier
author
Agapito Serrano, Juan Andrés
2023-06-20T13:41:28Z
2023-06-20T13:41:28Z
2004-09-22
84-930056-1-4
https://hdl.handle.net/20.500.14352/53399
http://www.inta.es
The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.
eng
Using optimization techniques to characterize irradiated CMOS analog switches
book part
URL
https://docta.ucm.es/bitstreams/06781b65-087d-47f1-a384-d4cb25a75fa1/download
File
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ce082026d8cd1665d02af4f55dfc6bcb
214307
application/pdf
RADECS04-Zong.pdf